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Epson NS8080SH IC Test Handler

Epson NS8080SH IC Test Handler

High throughput to support the testing of smartphone, tablet PC and automotive chips even in the most extreme production environments.

      • Up to 8 sites testing capability
      • Testing area from 184mm x 149mm
      • Up to 120Kgf contact force
      • UPH - up to 13,500 (ambient) &
      • Up to 8,200 (High Temperature)

  • 機型: NS8080SH

Blazing Fast Speeds

Enjoy high-speed transfer, testing and sorting of chip packages of 13,500 chips per hour with a contact force of up to 240kgf.

 

Extreme High-temperature

Support Test chips at temperatures as high as 155°C and easily recover from jams during high-temperature use.

 

Support for Wide Socket Pitches

With a layout that accommodates even wide socket pitches, conveniently test large numbers of chips, including high-frequency (RF) chips.