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首頁 商用系列 IC Handler Epson NX1032XS IC Test Handler

Epson NX1032XS IC Test Handler

Epson NX1032XS IC Test Handler

Developed using leading-edge robot technology, this IC test handler boasts significantly improved performance to support even the most demanding tests.

      • Up to 32 site testing capability
      • Testing area from 344mm x 244mm
      • Up to 430kgf contact force
      • UPH - up to 20,000 (Ambient) &
      • Up to 10,500 (High Temperature)

  • 機型: NX1032XS

Simultaneous Multi-site Tests

Maximum throughput of up to 20,000 chips per hour with simultaneous multi-site tests for 32 IC devices and high contact force of up to 4,800N.

 

Test Hand-independent Heat Press Method

Test chips at temperatures as high as 155°C and reduce jam recovery time.

 

Convenient Compatibility

Compatible with a wide range of changeover kits for the existing NS series (including adapter compatible changeover kits).